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Scanning Probe Microscopy

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  • 1. Multiple Choice
    30 seconds
    1 pt

    The AFM measures surfaces by

    Tracking the deflection of a laser beam off a cantilever

    Measuring the stress of the cantilever

    Piezoelectric deformation

    Tunnelling current

  • 2. Multiple Choice
    30 seconds
    1 pt

    Vertical resolution is higher than lateral resolution in the AFM

    True

    False - it's the opposite

    False - they're the same

  • 3. Multiple Choice
    30 seconds
    1 pt

    Tip radius limits the resolution in STM

    True

    False

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